Particular attention is paid to:

• Workplace organization
• Logistics
• Safe working environment
• Safe handling and disposal of waste  Standardized procedures and methods  Innovation
• Growth of productivity

Designed for high configurability, the COMPACT LINE, based on Seica’s NEXT> platform, meets the most different test requirements, allowing the user to choose the configuration that best suits the application. One of the main feature of the NEXT> platform is the possibility to provide the best integration of technology and easiness of use. Seica offers a turnkey solution where the following tests are automatically combined together in a production line based on the demand:

• In Circuit Test (ICT): Open/Short, R/L/C, Diodes, Transistors, FETs, regulators etc.
• OBP (On-board programming)
• Power ON and Functional (FUN) Test through CAN/LIN Interface etc.
• LED Test with sensors
• EOL Test
• RUN-IN Test
• Interactive Communication with Customer’s MES

The COMPACT NEXT> is specialized in configurations for synchronous and asynchronous parallel test according to the user’s production requirements. All of the Compact systems can be configured in multi-receiver and multi-job arrays to test up to 4 boards at the same time, ensuring:

• Test time reduction;
• Improved test throughput;
• Overall test cost reduction,
• More intensive use of instruments.

The iFUN is a base module for AWG (Arbitrary Waveform Generator) and/or DIGITIZER (Sampling Card) boards; it has a 4-quadrant grounded DC Voltage Generator with fixed current limit and 16-bit resolution. The DIGITIZER is a 16-bit sampling board. Controlled by the system PC through the high-speed and high-bandwidth fiber optic bus, the test backplane hosts digital and analog matrix cards and internal instruments.

The COMPACT test stations are managed by the Seica VIVA proprietary Software, which is a completely process-oriented test environment, designed to streamline test program development while the functional graphic environment guides the user through a series of automated operations in an intuitive, self-explanatory environment. The VIVA Software permits an easy and intuitive management of the CAD data, which are directly imported for test generation, validation and diagnostics purposes. Seica provides also advanced Design-for-Test programming solutions for high-mix PCB manufacturing. The new VIVA NEXT> is able to import product data either in its original CAD format, or in the form of machine programs, and convert into optimized test programs in a matter of seconds even for highly complex boards. This shows the amazing versatility of the NEXT> platform, which ensures that programs developed on other NEXT> systems, can be deployed on the compact NEXT> SERIES. This means that a program developed on a Pilot test system can be moved without additional efforts to a compact system, allowing the user to optimize production testing according to volume, throughput, test requirements, etc.

Thanks to its unique open architecture, the VIVA software is also compatible with numerous “front-end” packages and allows easy integration of external (.EXE. and .DLL) software modules, as well as
third party languages that might better respond to the desire of commonality with tools already in use at the end user plant. My View is more than a simple graphical user interface (GUI); it
is a VIVA software component that allows the customer to:

• Easily create a customizable and localizable MMI using a Seica Graphic Editor.
• Read from and write to the MyView controls at runtime from the external test software sequences.
• Run Python .NET code (IronPython) easily and directly from the external test software sequences.
• Drive all the Hardware modules with the Seica Software suite, external software tool or Python.
• Run the diagnostic test.

The systems can be housed in a variety of ergonomic enclosures that offer different levels of scalability.

 

COMPACT Multi

 

COMPACT TK

 

 

COMPACT CUBE

It is the ideal solution for all mixed ICT, pre-functional, functional, EOL and RUN-IN test. The versatility and scalability makes the COMPACT Multi NEXT>, the perfect test system suited for the integration of external instrumentation, capabilities and techniques in a single test program.

• Analog and Digital channels capabilities
• Power channels capabilities
• Optional Software in-circuit capabilities
• CAN, LIN, K-line, GPIB interfaces
• Pneumatic or Manual fixture receiver integrated
• Multiple programmable power supplies
• Resistive loads modules option
• High voltage/current capabilities
• 19” internal rack for instrument integration
• Parallel test option (max 4 jobs)
• On Board Programming (OBP) capabilities
• Radio Frequency (RF) Test up to 5G
• Digital channels up to 10 MHz
• Openfix capabilities

Seica offers other similar system solutions that can be adapted to any application: COMPACTNEXT> TK and CUBE.

COMPACT SL

The COMPACT SL NEXT> configuration offers a completely automated solution via an integrated, SMEMA compatible transport system, allowing completely automatic board handling and easy integration into high volume production lines. This automated system for in-line integration is perfect for ICT, pre-functional, functional and RUN-IN Test.

• SMEMA compliant in-line or stand-alone solution
• Up to 2048 Analog Channels
• Digital channels up to 10 MHz
• Openfix capabilities
• Up to 16 user power supplies
• Parallel test option (max 4 jobs)
• On board programming features
• GPIB, RS232, CAN, and other protocols management
• Motorized fixture receiver
• 19” internal rack for instrument integration

COMPACT RT

Seica meets the needs of the continuous driving market trend of Electronics PCBs miniaturization with the new COMPACT RT NEXT>. It is a fully automatic Rotary Table based system, ideal for medium/high volume production. It has been designed to provide immediate in-line robot integration to reduce the impact of DUT loading/unloading times. The first tangible sign is that the rotary table gives the benefit to save the loading/unloading time.

• In-line robot integration
• Very handy and ergonomic: 450 mm width
• Up to 640 Analog Channnels
• Functional test expandibility
• On Board Programming (OBP) test option
• Boundary scan test option
• Electrical Press fixture receiver
• Rotary Table

COMPACT DIGITAL

COMPACT DIGITAL NEXT> is Seica response to the constant demand for testing integrated devices via vector-based techniques and dedicated protocols such as Boundary Scan, without excluding the need to combine the in-circuit test as well.

• Analog, Digital and Hybrid channels capabilities
• ICT (In Circuit Test): Open/Short, R/L/C, Diodes, Transistors, FETs, regulators
• Up to 1536 Analog Channnels
• Functional testing
• On Board Programming (OBP) test option
• Boundary scan test option
• Digital test pattern